ISSN:
1572-9605
Keywords:
V-t curve
;
I c measurement
;
Ag-Bi2223 tapes
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Based on the collective creep model, we numerically studied evolution of electric field and current density in superconductors and its influence on transport measurements of critical current. It is shown that many experimental facts, such as the dependence of V-I curves on sweeping rate of applied current and voltage relaxation are the results of this evolution. The simulation results are confirmed by electric transport measurements on Ag-sheathed Bi2−x Pb x Sr2Ca2Cu3O y tapes. Discussions on influences of the voltage relaxation on electric transport measurements including superconducting critical current are made.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1007715411727
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