ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We present a new concept of a scanning-laser microscope that is integrated inside an encapsulated cryogenic sample stage. All the components of the microscope, i.e., a laser diode, the deflection unit, and the focusing optics, are cooled to the temperature of the sample under investigation. Furthermore, unwanted excitation of the sample, like excitation due to background radiation, is suppressed. Our technical solution meets the challenging experimental claims of a perfect shielding and low-temperature applicability further enables the sample to be exposed to strong magnetic fields. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147886
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