ISSN:
1572-817X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract We report a simple method to measure relative second-harmonic optical susceptibilities of crystals by use of Rayleigh scattering. We use two crystals with fixed alignments: one is a phase-matched crystal with varying degrees of phase matching, which serves as a reference point of the phase relationship and a source for the second-harmonic beam to be incident on the sample crystal, and the other is a sample crystal for measurement. The second-harmonic signals generated from each of the two crystals are superposed in the sample crystal to give Rayleigh scattering at the second-harmonic frequency, the analysis of which can determine the relative values of the second-harmonic optical susceptibilities of the sample crystals. We have applied this method to obtain d 14 (KDP)≃1.8 d 36 (KDP), d 36 (ADP)≃1.1 d 36 (KDP), d 31 (KTP)≃15 d 36 (KDP), d 32 (KTP)≃13 d 36 (KDP), where d 36 of KDP crystals was taken as a reference.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00430191
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