ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We are using the Tokyo electron beam ion trap (Tokyo-EBIT) to study a wide range of the physics of highly charged ions. Transition wavelengths have been investigated using visible and x-ray spectroscopy. The charge-state distributions of the extracted ions from the trap are shown for the different experimental conditions. Ionization cross sections are measured by observing the time dependence of the charge state evolution in the extracted ions. A brief introduction of the recent studies is given. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150261
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