ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
In measurement of the microwave surface resistance, Rs(T), of a high-Tc film with a host-cavity method, in which the cavity material is usually copper, the systematic error in Rs at low temperature can be significantly reduced through calibration with the data obtained by a niobium host cavity. Using a cavity excited in the TE011 mode at 13.6 GHz, the procedure is illustrated for a c-axis oriented YBa2Cu3O7−δ film fabricated on 36 mm diameter copper disk with yttria-stabilized-zirconia and chromium buffer layers. The temperature dependence in Rs(T) was consistent with that of the penetration depth; both quantities behavior could be fit well by a modified two-fluid model, in which the fraction of the pairing normal carriers obeyed (T/Tc)2 rather than (T/Tc)4 with some 20% of the charge carriers remaining normal. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.372434
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