Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
63 (1988), S. 3278-3278
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Because of its application as recording media for high-density recording, oblique incidence thin films have been studied by many investigators. It is well known that oblique incidence thin films have a columnar structure, however, localized microstructural information, i.e., obtained directly from individual columns, has not yet been reported. In this study, the microstructure of CoNi oblique incidence thin films have been examined by transmission electron microscopy and microdiffraction technique. Results of thin films prepared with various incident angles indicate that the columns in oblique incidence thin films are single crystals and the c axis of the columns does not necessarily coincide with the column axis. These results and results of the effect of incident angle on column alignment and on the c-axis texture will be presented in this paper.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.340812
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