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  • 1
    Electronic Resource
    Electronic Resource
    Discrimination between adsorption and coprecipitation in aquatic particle standards by surface analysis techniques: lead distributions in calcium carbonates (1988)
    s.l. : American Chemical Society
    Environmental science & technology 22 (1988), S. 463-467 
    Details
    ISSN: 1520-5851
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/es00169a016
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  • 2
    Electronic Resource
    Electronic Resource
    Quantitation of coverages on rough surfaces by XPS: An overview (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 13 (1988), S. 186-192 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Selected methods for the XPS quantitation of surface coverages are summarized with an emphasis on non-planar samples with overlayers, e.g. powders of high surface area. Equations have been modified for uniform terminology and are presented based on a photoelectron spectrometer with an E-1 transmission function. Approaches which require a minimum of information from independent analytical techniques are given special consideration. Quantitative schemes discussed include calibration curves, surface sensitivity factors, exponential attenuation of bulk signals by overlayers, catalyst models, and the use of subshell twins or peak shape distortions related to photoelectron energy losses.
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740130404
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  • 3
    Electronic Resource
    Electronic Resource
    Application of angle-resolved XPS algorithms to overlayers and concentration gradients (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 621-630 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Angle-resolved XPS data from three different sample types was used to compare algorithms for the determination of overlayer thickness and/or concentration gradients. Samples included SiO2 on Si, epitaxial Si0.862Ge0.138 on Si and As implanted in Si. Two algorithms for the determination of overlayer thickness (the relative ratio and patchy overlayer algorithms) and two algorithms based on Laplace transform or regularization methods for the evaluation of concentration gradients were evaluated. For the SiO2 and As-implanted samples, results representative of the sample type were obtained. However, the composition profiles from the Laplace algorithms showed the expected sharp interface between the Si substrate and the SiGe overlayer, while the regularization algorithm did not. All of the algorithms have correlating parameters, and absolute results depend upon the normalization method, electron attenuation length values and other algorithm-dependent terms. A comparison of angle-resolved XPS data from different samples thus requires careful and consistent choices for algorithm parameters.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210905
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  • 4
    Electronic Resource
    Electronic Resource
    High-resolution x-ray photoelectron spectroscopy of aliphatic hydrocarbons (1998)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 278-289 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; x-ray photoelectron spectroscopy ; aliphatic ; hydrocarbon ; high resolution ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Comparison of high-resolution core-level spectra from simple long-chain aliphatic hydrocarbons and hydrocarbon polymers show minor differences between ideal, specially prepared samples and samples of ‘as-received’ materials. Asymmetric peaks whose structure may be attributed to vibrational-level excitation can be resolved easily under conditions that do not cause damage. This asymmetric structure is independent of sample morphology and sampling depth. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Determination of overlayer thickness by angle-resolved XPS: A comparison of algorithms (1993)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 161-173 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Angle-resolved XPS data from two well-characterized samples of SiO2 on Si were analyzed using three different algorithms for the determination of overlayer thickness. The relative ratio algorithm, the Heaviside step function approximation to the Laplace transform algorithm and the absolute ratio algorithm were compared in terms of the d/λ values calculated, correlated parameters, experimental requirements, goodness-of-fit and sensitivity to overlayer thickness variation. Although an inverse correlation exists between the normalization parameter and d/λ for the relative ratio algorithm, this algorithm is recommended over the absolute ratio algorithm and the Laplace transform algorithm for the determination of overlayer thicknesses. The relative ratio algorithm results in the most accurate overlayer thickness ratio and is more sensitive to overlayer thickness variations than the other algorithms.
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740200211
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  • 6
    Electronic Resource
    Electronic Resource
    Imaging of polymer surfaces using X-ray photoelectron spectroscopy (1994)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 79-86 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Applications of x-ray photoelectron spectroscopy imaging in the analysis of heterogeneous polymer surfaces are evaluated using a sample containing tetrafluoroethylene plasma-deposited onto polyethylene. The C 1s and F 1s images acquired using non-monochromatic Mg Kα and monochromatic Al Kα x-ray sources are used to demonstrate good charge stabilization, as confirmed by small-area spectra. The use of non-monochromatic flood sources vs. monochromatic focused x-ray ray sources for image acquisition is discussed. The use of the valence band region for imaging is also demonstrated.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740210204
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  • 7
    Electronic Resource
    Electronic Resource
    Differential Charging in XPS. Part II: Sample Mounting and X-ray Flux Effects on Heterogeneous Samples (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 459-468 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Factors which affect photoelectron peak positions on heterogeneous samples are evaluated using patterned indium tin oxide (ITO) on glass. Local sample environment, sample mounting and spatial variation in x-ray flux are all shown to contribute to differential charging effects if no charge neutralization is used. X-ray photoelectron spectroscopy data acquisition using both Mg Kα and monochromatic Al Kα x-ray sources shows that confusing and potentially misleading results can be obtained if samples are mounted such that only part of the surface is grounded to the spectrometer. In this case, multiple photoelectron peaks were observed for each photoelectron line of each element in the sample. However, more significant differential charging artifacts were observed from the insulating glass than from the ITO. The proximal causes of the photoelectron peak shifts were evaluated using imaging XPS in conjunction with small-area spectroscopy.
    Additional Material: 19 Ill.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Differential Charging in XPS. Part I: Demonstration of Lateral Charging in a Bulk Insulator Using Imaging XPS (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 422-427 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Recent literature has drawn a distinction between charging across the surface (lateral differential charging) and charging with depth (vertical differential charging) for insulating samples. In this study, differential charging in a bulk insulator was investigated using imaging and small-area spectra acquired with a monochromatic x-ray source. With no charge neutralization, reproducible photoelectron images and spectra could be acquired from a glass sample after ∽90 min of x-ray exposure. The charge shifts and photoelectron peak shapes vary as a function of x-ray flux on the sample, indicating that lateral charging is the dominant mechanism on a bulk insulator. Uniform binding energies, photoelectron peak shapes and images are acquired with the charge neutralizer on.
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Differential charging in XPS. Part III. A comparison of charging in thin polymer overlayers on conducting and non-conducting substrates (1997)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 904-912 
    Details
    ISSN: 0142-2421
    Keywords: XPS ; charging ; polymer ; overlayers ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Previous work has used small-area and imaging XPS to show that differential charging in bulk insulators develops as a result of non-uniform x-ray flux across the surface, causing lateral differential charging. Charging in heterogeneous samples can be further affected by the local sample environment and sample mounting. The current work extends these studies through an analysis of differential charging effects in thin overlayers on conducting and insulating substrates. The charging observed in PnBMA overlayers on indium tin oxide, glass, Ag and Al is discussed as a function of substrate conductivity and photoelectron cross-sections. Substrate conductivity is the most significant factor in determining the magnitude of the overlayer charging observed when no charge compensation is utilized. Differential charging in the PnBMA overlayer was used to image a patterned substrate containing insulating and conducting areas. © 1997 John Wiley & Sons, Ltd.
    Additional Material: 17 Ill.
    Type of Medium: Electronic Resource
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  • 10
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    Oriented Monolayers Prepared from Lyotropic Chromonic Liquid Crystal (2005)
    American Chemical Society
    Details
    Publication Date: 2005-03-01
    Print ISSN: 0743-7463
    Electronic ISSN: 1520-5827
    Topics: Chemistry and Pharmacology
    Published by American Chemical Society
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