Publication Date:
2015-01-22
Description:
The complex refractive index of graphene fabricated using chemical vapor deposition is characterized at 1550 nm wavelength through the reflectivity measurement on a SiO 2 /Si substrate. The observed tunability of the complex reflective index as the function of gate electric voltage is in agreement with the prediction based on the Kubo formula.
Print ISSN:
0003-6951
Electronic ISSN:
1077-3118
Topics:
Physics
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