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  • 1
    Electronic Resource
    Electronic Resource
    Diagnostic measurement of ion implantation dose and uniformity with a laboratory-based positron probe (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 5988-5992 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The development of a sensitive, depth-tuneable probe, with mapping capability, for low-energy ion implantation dosimetry, is described. The technique is based on the dependence of the extent of Doppler broadening of the positron annihilation linewidth upon the concentration of open-volume defects produced by the implanted ions. By varying the incident positron energy one can ensure that most of the annihilation events occur near the damage peak. A series of diagnostic measurements have been performed which demonstrate that the positron response lies on an almost universal curve, independent of ion mass and energy. The probe is highly sensitive, with a dose threshold in the 10−9 cm−2 range for many implants, and has the potential to measure dose/dose uniformity to better than 1×1011 cm−2 in the 1011−1012 cm−2 range in run times of a few seconds. Considerations underlying the development of a practical instrument based on these findings are discussed. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371644
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  • 2
    Electronic Resource
    Electronic Resource
    Stopping of 10–50 keV positrons in aluminum (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 164-166 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report on new observations of positron stopping in a series of Al foils mounted on glass backplates for incident energies E in the range 10–50 keV. The measured median penetration depths for E(approximately-greater-than)30 keV are found to differ significantly from values derived from the empirical power law model of A. P. Mills, Jr. and R. J. Wilson [Phys. Rev. A 26, 490 (1982)]. The associated disparity between the measured implantation profiles and their analytic representations, and the consequent implications for defect profiling analysis, are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.106007
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  • 3
    Electronic Resource
    Electronic Resource
    Material dependence of positron implantation depths (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 2962-2964 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: New experiments and Monte Carlo simulations of positron implantation in gold are presented which, when compared with earlier work on aluminum, clearly demonstrate that the material dependence of positron implantation profiles is not adequately described by the simple mass density scaling factor in the widely used expression for median implantation depths. There is excellent agreement between the experimental results and the simulations which use the Penn dielectric formalism to describe inelastic scattering.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.105812
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  • 4
    Electronic Resource
    Electronic Resource
    Simple expression for vacancy concentrations at half ion range following MeV ion implantation of silicon (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 947-949 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Mean concentrations CD of aggregated vacancy-type point-defect structures in float-zone Si implanted with H+, B+, Si+, O+, and Ge2+ ions at energies between 0.45 and 4.0 MeV have been measured as a function of ion dose φ at depths ∼RP/2 (half projected ion range) by beam-based positron spectroscopy. By adjusting φ to φA using factors given by the code TRIM, one arrives at the universal expression CD=(2.79×1010) φA0.63; CD (cm−3) can be estimated to ±50% for MeV ions implanted for φA from 109×1013 cm−2, which corresponds to an upper limit dose approaching 1014 cm−2 for 2 MeV Si+ implantation. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1448856
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  • 5
    Electronic Resource
    Electronic Resource
    Measurement of positron-rare gas total cross-sections at intermediate energies (1976)
    Springer
    Applied physics 11 (1976), S. 321-325 
    Details
    ISSN: 1432-0630
    Keywords: 78.70
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Total scattering cross-sections for positrons in the rare gases in the energy range of 2–960 eV have been measured using a time-of-flight system for which the uncertainty arising from forward scattering is substantially lower than in the 1974 experiment of Canter et al. A comparison of these cross-sections with current theoretical estimates is made.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00919360
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  • 6
    Electronic Resource
    Electronic Resource
    The emission of slow positrons from magnesium oxide powder (1981)
    Springer
    Applied physics 25 (1981), S. 269-271 
    Details
    ISSN: 1432-0630
    Keywords: 07.77+p
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract From Monte Carlo analyses of measured time-of-flight spectra for slow positrons traveling down a tube which is first evacuated and then filled with low-density helium gas, it is shown that the positrons leave the MgO-coated source grid at angles close to the normal direction. This result is important for low-energy positron collision studies. An interpretation of the result based on the surface charge held by the oxide is proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00902981
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  • 7
    Electronic Resource
    Electronic Resource
    Measurement of total scattering cross-sections for positrons of energies 2–400 eV on molecular gases: H2, D2, N2, CO (1974)
    Springer
    Applied physics 4 (1974), S. 89-90 
    Details
    ISSN: 1432-0630
    Keywords: Positron-molecular gas cross-sections ; Cross-section measurements:e +-molecular gases
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The results of a time-of-flight experiment are presented, in which the total cross-sections for 2–400 eV positrons on H2, D2, N2, and CO were measured.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00884160
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  • 8
    Electronic Resource
    Electronic Resource
    Total cross-section measurements for 2–400 eV positrons in the rare gases (1974)
    Springer
    Applied physics 3 (1974), S. 249-249 
    Details
    ISSN: 1432-0630
    Keywords: Positron-rare gas cross-sections ; Cross-section measurements:e +-rare gases
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Experimentally determined values of the total scattering cross-sections for positrons in the energy range 2–400 eV on He, Ne, Ar, Kr and Xe are presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00884506
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  • 9
    Electronic Resource
    Electronic Resource
    A simple positron lifetime system suitable for low density gases (1974)
    Springer
    Applied physics 3 (1974), S. 271-273 
    Details
    ISSN: 1432-0630
    Keywords: Positron annihilation ; Positron lifetimes in gases
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract A conventional positron lifetime system is described which gives data of high statistical accuracy and is especially suitable for gases at low density. Several factors contribute to the significant improvement in performance. The fraction of positrons annihilating in the gas is greatly enhanced by backscattering, and the small dimensions of the pressure vessel coupled with large plastic scintillators yields about 1200 coincidence events per second. Simple electronics are used with no side channel gating, and very clean spectra are obtained with overall resolution better than 1.5 nsec. The true start and stop pulses are counted, which enables the data to be treated by the authors' signal restoration method. The results of measurements in Ar−CO mixtures and data for H2 and D2 are presented and discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00887274
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  • 10
    Electronic Resource
    Electronic Resource
    The analysis of data obtained with time to amplitude converter and multichannel analyser systems (1974)
    Springer
    Applied physics 5 (1974), S. 223-230 
    Details
    ISSN: 1432-0630
    Keywords: Positron annihilation ; Analysis of t.a.c.-m.c.a. data
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract An exact general formula is derived relating the data obtained from t.a.c-m.c.a. systems to the input signal distribution; it is shown how the latter is modified by the measuring process. A general method of data correction is given, together with important approximations, which evaluates the input signal distribution from the data without any loss of signal. A simple and accurate method of system calibration based only on counting and not requiring the use of calibrated delay lines is also given.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00928133
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