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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Analytical chemistry 64 (1992), S. 2084-2089 
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 94 (1991), S. 3629-3632 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Electron attachment cross sections are reported in the energy range 0–160 meV, and at resolutions of 6.0–6.5 meV (FWHM) for the molecules CF3SO3H (triflic acid), (CF3SO2)2O (triflic anhydride), and CF3I (methyl iodide). Use is made of the Kr photoionization method. Attachment line shapes are deconvoluted from the spectral slit (electron energy) function, and are converted to cross sections by normalization to thermal attachment rate constants at 300 K. Rate constants as a function of mean electron energy are calculated from the cross sections using a Maxwellian electron energy distribution function. Present data are compared with flowing-afterglow, Langmuir-probe (FALP) results in triflic acid and anhydride, and with high-Rydberg ionization results in CF3I.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 97 (1992), S. 4111-4114 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Optical emission has been observed corresponding to vibrational bands in the NH (A 3Π→X 3Σ−) electronic transition during collisions of 5 eV, ground-state oxygen O(3P) atoms with MgF2 and Ni surfaces continuously exposed to a beam of hydrazine (N2H4). The NH emission intensity is observed to be about five times greater for MgF2 than for Ni. No dependence on temperature was observed for either surface in the range 240–340 K, implying that the NH-producing intermediate species is tightly bound. The half-lifetime for desorption of hydrazine from each surface was measured. This was found to be 120 min for the MgF2 surface at 240 K, and ≤20 min for Ni. After exposure the surface composition was measured using x-ray photoelectron spectroscopy (XPS) on the exposed and unexposed areas of both targets.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 1135-1139 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and performance of a new-type source of negative ions is presented. This device retains the idea of the so-called reversal electron attachment detector [READ, M. T. Bernius and A. Chutjian, J. Appl. Phys. 66, 2783 (1989)] to produce low-energy electrons by reversing electron trajectories at an electrode. Electrons are produced in the present device by several ribbon filaments that surround a cylindrical wire grid. They are accelerated through the grid, then decelerated to zero, or near-zero velocity at the surface of a tube. The tube (anode) is perforated with small holes through which effuse the target molecules. Electrons attach to form either parent and/or fragment negative ions. Attachment takes place at a location above the anode corresponding to a match between the electron energy and the attachment resonance energy. Negative ions are pulsed out of the attachment region and focused onto the entrance plane of a quadrupole mass selector. Electron and ion trajectory calculations are presented, and the performance illustrated with six molecules having attachment resonances in the range 0.0–2.2 eV. The detection sensitivity as measured using the method of standard additions is below 1 part-per-trillion, with a calculated conversion rate (ions/electrons) of 1.3%. Signal nonlinearity is discussed in terms of ion space-charge effects. The device also produces positive ions, and an analogous treatment may be carried through to characterize its performance in this mode.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 470-476 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Theoretical considerations and test results are presented for a new-type velocity analyzer for incident fast neutral particles, positive ions, and negative ions. Velocity analysis is carried out by means of a pulsed, three-gate time-of-flight (TOF) technique capable of eliminating alias velocities (harmonics) to sixth order. In addition the design and operation are presented of a four-element ion lens system, with small spherical and chromatic aberrations, suitable for interfacing a large-diameter ion beam from the TOF section with a subsequent mass analyzer.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 421-423 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A silicon wafer has been oxidized at room temperature in vacuum using a pure, ground-state beam of O− ions. The beam was of sufficiently low energy that no displacement damage or implantation was energetically possible. The resulting SiO2 films were analyzed with x-ray photoelectron spectroscopy. A logarithmic dependence of oxide thickness on dose was observed, with an extrapolated oxidation efficiency of unity for the clean silicon surface. A distinct initial oxidation phase was observed, with an anomalously high level of silicon suboxides. In addition, the valence-band offset between the silicon and the oxide was unusually small, suggesting a large interfacial dipole.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 397-401 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Effects of H− production in a multicusp ion source are measured by separately mixing with hydrogen small amounts (0.33%–10%) of water, ammonia, methane, and hydrazine—molecules which produce large amounts of H− via dissociative attachment (DA) resonances at higher electron energies. The mixing was done in a separate reservoir, with careful measurement of individual pressures. Experimental enhancements of 1.4 and less were observed, whereas calculated enhancements, using accurate DA cross sections for ground-state H2, should have produced factors of 1.5, 3.0, 1.3, and 2.4 enhancements for water, ammonia, methane, and hydrazine, respectively, at a mean electron energy of 1.0 eV in the extraction region. The difference is accounted for by including, in the enhancement calculation, vibrationally and rotationally excited H2 molecules, with v‘=5–11, and J‘=0–5, and the large DA cross sections for the excited H2(v‘,J‘). The relative populations of H2(v‘,J‘) thus obtained are found to be substantially smaller than those predicted by theoretical calculations. The effect on H− current was also studied by mixing small amounts of SF6 with H2. A 1.5% mixture was found to reduce the H− output by one half.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 2254-2265 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An inclined beams apparatus for the measurement of absolute cross sections for dielectronic recombination between free electrons and singly or multiply charged ions is described. The collision products, a photon and a lower-charge-state ion, are detected in delayed coincidence. Measurements of dielectronic recombination in C3+ are described to illustrate the use of the apparatus and techniques. Verification of the calibrations and operation of the apparatus is demonstrated through measurements of charge transfer and electron impact excitation.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 69-72 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We demonstrate a new type of ion source for producing either pulsed or continuous negative ion beams. The source, dubbed the "reversal ion source,'' utilizes an electrostatic "mirror'' which reverses trajectories in an electron beam, producing electrons at their turning point having a distribution of velocities centered at zero velocity. A gas which attaches zero-velocity electrons is introduced at this turning point. Negative ions are produced by the attachment or dissociative attachment process. The cross section for this process is extremely large, varying as (electron energy)−1/2, or just the s-wave threshold law. The operation of the source is demonstrated for continuous and pulsed production of Cl− beams by dissociative attachment to CFCl3. Estimates of the current density of this source are given, and applications to the production of ions through higher energy resonances are discussed.
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1393-1397 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A miniature quadrupole mass spectrometer array consisting of 16 rods in a 4×4 array is reported. Each rod is 25 mm in length and 2 mm in diameter. The ionizer is of a miniature Nier-type design, and the detector is a channel-type electron multiplier. Operating frequencies are 5.3, 7.1, and 12.9 MHz. The mass range demonstrated herein is 1–300 u; and the resolution of the system is 0.1–0.5 u (full width at half-maximum), or m/Δm=600. The present sensitivity is calculated and measured to be approximately 1×1012 counts/Torr s. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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