ISSN:
1434-6036
Keywords:
PACS. 61.10.Kw X-ray reflectometry (surfaces, interfaces, films) - 61.46.+w Clusters, nanoparticles, and nanocrystalline materials - 68.55.-a Thin film structure and morphology
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract: It is shown here that the observation of the phenomenon of like small angle scattering of X-rays in very thin heterogeneous films, can be made comparatively easily by using grazing angle reflectometry of X-rays. The feasibility was achieved with co-sputtered thin films of approximately 600 Å thickness, made up by crystalline platinum clusters embedded in an amorphous alumina matrix. The experimental reflectivity profiles are simulated by the intensity superposition of two components: (i) the specular part caused by the usual interference phenomenon between the partial waves reflected from the air-film and film-substrate interfaces, and (ii) the like-small angle scattering part due to diffraction by platinum clusters. It is found that the shape of such clusters is spherical characterized by mean values of diameter and inter-cluster distance of the order 29 Å and 45 Å respectively with standard deviations and of the order of 3 Å. Such an observation of both the interference and diffraction phenomena indicates that the thin granular film exhibits both its continuous and heterogeneous aspects together.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s100510050620
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