ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Call number: MOP Per 27(20,9)
    In: Geofysiske publikasjoner
    Type of Medium: Monograph available for loan
    Series Statement: Geofysiske Publikasjoner 20,9
    Location: MOP - must be ordered
    Branch Library: GFZ Library
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 2
    Publication Date: 2017-12-14
    Description: Surface melt and subsequent firn air depletion can ultimately lead to disintegration of Antarctic ice shelves1,2 causing grounded glaciers to accelerate3 and sea level to rise. In the Antarctic Peninsula, foehn winds enhance melting near the grounding line4, which in the recent past has led to the disintegration of the most northerly ice shelves5,6. Here, we provide observational and model evidence that this process also occurs over an East Antarctic ice shelf, where meltwaterinduced firn air depletion is found in the grounding zone. Unlike the Antarctic Peninsula, where foehn events originate from episodic interaction of the circumpolar westerlies with the topography, in coastal East Antarctica high temperatures are caused by persistent katabatic winds originating from the ice sheet’s interior. Katabatic winds warm and mix the air as it flows downward and cause widespread snow erosion, explaining 〉3 K higher near-surface temperatures in summer and surface melt doubling in the grounding zone compared with its surroundings. Additionally, these winds expose blue ice and firn with lower surface albedo, further enhancing melt. The in situ observation of supraglacial flow and englacial storage of meltwater suggests that ice-shelf grounding zones in East Antarctica, like their Antarctic Peninsula counterparts, are vulnerable to hydrofracturing7.
    Repository Name: EPIC Alfred Wegener Institut
    Type: Article , isiRev
    Format: application/pdf
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 3
    facet.materialart.
    Unknown
    In:  EPIC3EGU General Assembly 2016, Vienna, Austria, 2016-04-17-2016-04-22
    Publication Date: 2017-10-17
    Description: Ice-shelf channels (along-flow lineations in which ice is thinner) are ubiquitous in Antarctic ice shelves. Although these features are readily visible in satellite imagery, ice-thickness and ice-velocity variations in their surrounding are typically heavily undersampled. Ice-shelf channels focus channelized melting and significantly alter the basal mass balance (and hence ice-shelf stability) on short horizontal scales. Here we use interferometrically-derived TandDEM-X digital elevation models and ice-flow velocities with a horizontal gridding of 125 m illustrating the ice-shelf dynamics of the Roi Baudouin Ice Shelf, Dronning Maud Land (East Antarctica) in unprecedented detail. Using ground-based GPS surface elevation, we demonstrate that TanDEM-X is an ideal sensor to map the channel morphology at the ice-shelf surface. We find velocity anomalies surrounding the channels along the entire ice shelf potentially indicating the presence of locally elevated basal melt rates. Using mass conservation in a Lagrangian framework, we find basal melt rates averaging 0.4 m/a in the middle of the ice shelf and peaking at 12 m/a inside some channels.We illustrate the sensitivity of the method with respect to systematic biases in elevation/velocity and also with respect to lateral variations of the depth-density relationship. With the increased availability of high-resolution radar satellites (such as Sentinel1), the techniques presented here could be applied on an pan-Antarctic scale to map basal melting both in space and time at high-resolution.
    Repository Name: EPIC Alfred Wegener Institut
    Type: Conference , notRev
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 4
    Publication Date: 2017-05-22
    Description: Ice-shelf channels are long curvilinear tracts of thin ice found on Antarctic ice shelves. Many of them originate near the grounding line, but their formation mechanisms remain poorly understood. Here we use ice-penetrating radar data from Roi Baudouin Ice Shelf, East Antarctica, to infer that the morphology of several ice-shelf channels is seeded upstream of the grounding line by large basal obstacles indenting the ice from below. We interpret each obstacle as an esker ridge formed from sediments deposited by subglacial water conduits, and calculate that the eskers’ size grows towards the grounding line where deposition rates are maximum. Relict features on the shelf indicate that these linked systems of subglacial conduits and ice-shelf channels have been changing over the past few centuries. Because ice-shelf channels are loci where intense melting occurs to thin an ice shelf, these findings expose a novel link between subglacial drainage, sedimentation and ice-shelf stability.
    Repository Name: EPIC Alfred Wegener Institut
    Type: Article , isiRev
    Format: application/pdf
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 6888-6902 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Image blurring as a result of stochastic particle–particle interactions has been investigated for projection electron- and ion-beam lithography systems. A comparative analysis of the currently available analytical theories is presented. The results from these theories are also compared with Monte Carlo simulation results and experimental data. Large variations in results and serious disagreements between the different theoretical approaches are found. We have formulated a new theory on the basis of a simple, analytical approach that overcomes most of the difficulties experienced by earlier theories with two key concepts: consideration of nearest-neighbor interactions only, and a randomization length, over which the interactions are correlated. Our model displays satisfactory functional and numerical agreement with Monte Carlo simulation results over a large range of beam currents, as well as with the only available experimental data. The physical basis of our model also enables us to understand the origins of the discrepancies arising from earlier theories. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 5890-5893 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of Ar ion implantation energy to amorphize the (100)Si substrate and heat treatments on the I-V characteristics was studied. It was found that the electrical resistance of the contacts increased as a result of increasing the ion implantation energy, the heat treatment temperature, and time. The I-V characteristics of the contacts are analyzed with a model of electrical conductivity in amorphous solids. Based on this model and the experimental results, the distance between two adjacent ionized defects that are active in the electrical conductivity, was calculated. The effect of ion implantation energy and the heat treatments on the I-V characteristics are correlated to the microstructural and compositional alterations in the amorphous Si region of the contacts.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 4341-4343 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of heat treatments on the structure and composition of a system consisting of a conductive outer layer made of Al(0.8% Si) thin film, TiW(30:70 at. %) thin film as a diffusion barrier, and a polycrystalline Si substrate was studied. It was established that heat treatments at temperatures ranging between 400 and 500 °C led to the diffusion of Si and Al through the TiW layer, following which Al diffused into the polycrystalline Si, while Si diffused into the Al film. The silicides of TiSi, TiSi2, and intermetallic compounds of Al3Ti and WAl12 were formed at the Al/TiW interface as a result of the 30-min heat treatment at temperatures ranging between 450 and 500 °C.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Fluids 31 (1988), S. 486-494 
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The major flow development in the region within a distance O((aR)1/2) from the entrance of a curved pipe occurs near the pipe wall, where a is the radius of the pipe cross section, assumed circular, and R is the radius of curvature of the central axis of the pipe. A three-dimensional boundary-layer solution is obtained for elucidating the physics of this developing flow; in particular, the effect of nonzero curvature ratio α=a/R on the geometric similarity of the flow. The numerical results show that the series solution in terms of α is valid only when α≤0.1 and s≤0.1 (aR)1/2, where s is the distance from the inlet along the pipe axis. The crossover of the axial wall shear is purely a geometric property and its location is a strong function of α. It is also demonstrated that (aR)1/2 is the proper length scale by showing that the solution of the first region, s∼O(a), is included in that of the second, s∼O(aR)1/2.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Physics of Fluids 7 (1995), S. 972-982 
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The sensitivity of the onset and the location of vortex breakdowns in concentrated vortex cores, and the pronounced tendency of the breakdowns to move upstream have been characteristic observations of experimental investigations; they have also been features of numerical simulations and led to questions about the validity of these simulations. This movement upstream may be a migration in time for fixed values of the relevant parameters, or the movement of the breakdown location closer to the entrance to the flow or computational domain with small changes in these parameters. This behavior seems to be inconsistent with the strong time-like axial evolution of the flow, as expressed explicitly, for example, by the quasicylindrical approximate equations for this flow. An order-of-magnitude analysis of the equations of motion near breakdown leads to a modified set of governing equations, analysis of which demonstrates that the interplay between radial inertial, pressure, and viscous forces gives an elliptic character to these concentrated swirling flows. Analytical, asymptotic, and numerical solutions of a simplified nonlinear equation are presented; these qualitatively exhibit the features of vortex onset and location noted above. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 3025-3031 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of rapid thermal annealing on the composition, structure, and I-V characteristics of Al(0.8% Si)/Ti:W/a-Si contacts was studied. It was established that heat treatments in temperatures ranging between 300 and 500 °C for a time span of 10 s led to grain boundary diffusion of Si and Al through the Ti10W90 layer. Subsequently, Si diffused into the Al film while Al penetrated into the amorphous Si. No silicides or intermetallic compounds were observed to form as a result of the rapid heat treatments. The electrical measurements showed that the I-V curve in the forward bias is identical to that of the reversed bias. The electrical resistance of the contacts increased as a result of a rise in the heat treatment temperature. A model of electrical conductivity in amorphous semiconductors was applied to explain the electrical behavior of the contacts.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...