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  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 181-184 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The refractive index, n, for X-rays is measured by interposing a prism in the path of X-rays falling on a perfect silicon crystal at the Bragg incidence angle. Owing to the deviation angle of the prism, the separation of the two wave fields excited in the silicon crystal is modified, from which the value of n − 1 can be deduced with a 1% accuracy. The method has been applied to the measurement of the anomalous dispersion correction for the refractive index of zirconium for Mo Kα.
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 12 (1979), S. 138-138 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 18 (1985), S. 93-105 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A systematic study of the variations of the contrast of a dislocation in silicon on section topographs with the depth of the line was performed both experimentally and with computer simulations. Mo Kα1 radiation and 33{\bar 3} and {\bar 3}{\bar 3}3 symmetric reflections were used. The crystal thickness was 440 μm so that the value of μt was 0.64. The influence of the orientation of the dislocation was studied for values of the angle between the line and its Burgers vector ranging between 60 and 90° in the glide plane. It was observed that when the dislocation lies close to the entrance surface, whatever its orientation, its image is centred around the trace of the plane of incidence passing through the intersection of the dislocation with the direct beam while when the dislocation lies close to the exit surface its image is centred around the projection of the dislocation on the section pattern. The variation of the orientation of the image for intermediate depths of the dislocation is interpreted by means of the geometrical construction of the dynamical image. The values of the orientation of the image calculated according to this simple model are in good agreement with those measured on both experimental and simulated topographs. The same geometrical model enables the difference in the relative positions of the direct and dynamic images of stereo pairs to be explained. A new feature was observed in the simulated images and several of the experimental ones, namely a concentration of intensity along the projection of the dislocation in the reflected direction. Slit width was taken into account in the simulations for a better fit with experimental topographs but not polarization, which was taken to be normal to the plane of incidence. Because of the small value of the crystal thickness and of μt, the variation of the contrast with the Burgers vector is very small, making its determination very difficult.
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  • 4
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 995-996 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 42 (1986), S. 414-426 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The classical equations of dynamical theory in the Bragg case are rederived in a way which is valid even in the presence of absorption where every quantity used is complex. The properties of the phase and the amplitude of the diffracted wave are discussed in detail. It is shown that for non-centrosymmetric crystals the position of the nodes at the centre of the reflection domain is strongly absorption dependent. The limit of the phase of the ratio of the diffracted to the incident amplitude far from the reflection domain is calculated to be equal to φh + π and φh, below and above the reflection domain, respectively, where φh is the phase of the structure factor calculated taking into account anomalous dispersion and the imaginary part of the form factor. It is therefore absorption dependent and so is the position of the nodes of stationary waves which is never invariant with the angular position of the crystal, even outside the total reflection domain. The example of a non-centrosymmetric crystal, GaAs, opposite reflections, 111 and {\bar 1}{\bar 1}{\bar 1}, and of wavelengths close to the absorption edges of gallium and arsenic is used to illustrate the results. It shows that the absorption-induced shifts of the nodal planes are in general directed towards the surface of the crystal, independently of the sense of the diffraction vector. The variation of the penetration depth within the total reflection is interpreted in the non-absorbing case by means of a new surface which completes the dispersion surface within the Bragg gap.
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  • 6
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 17 (1964), S. 1617-1617 
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 24 (1968), S. 126-136 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Takagi's theory is used to calculate the propagation of X-rays in perfect and nearly perfect crystals. In the general case, the equations have to be solved on a computer. The principle of the calculation is given. It has been applied to the case where an incident plane wave is collimated by a slit. The separation of wavefields is observed, each presenting a fine structure shown to be due to the diffraction by the slit. The same calculation is extended to a crystal submitted to a thermal gradient.The propagation and the intensities of wavefields are in good agreement with the predictions of Penning and Polder.
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 26 (1970), S. 647-654 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Takagi's equations of X-ray diffraction by an imperfect crystal are solved in the most general case by the method used in a previous paper in the particular case of a perfect crystal. It is shown that, for small strain gradients, the amplitude inside the crystal is the sum of two generalized wavefields obtained by convolution of the Hankel functions H10 and H20 with a `source distribution' depending on local deformations. This is in agreement with the results given by other authors (Kato, Penning, Malgrange). This corresponds to the approximation of geometrical optics for X-ray propagation in crystals. A quantitative criterion of validity for this approximation is given. When this criterion is not fulfilled in some part of the crystal, the generalized wavefields are diffracted. It is shown that this implies creation of new generalized wavefields. This provides a physical interpretation of the occurrence of this phenomenon in the vicinity of a dislocation line and properties of the contrast of images in X-ray topography.
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  • 9
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 9 (1956), S. 411-416 
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 24 (1968), S. 527-534 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A particular moiré fringe pattern is observed on X-ray topographs in silicon crystals irradiated by protons. The kinematical theory of X-ray diffraction explains very well the geometry of these fringes on traverse topographs. Takagi's dynamical theory of X-ray diffraction is used to calculate the fringe contrast on section topographs. There is a good agreement between theory and experiment.
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