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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Solar physics 5 (1968), S. 87-101 
    ISSN: 1573-093X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract An interesting coronal structure was observed during the solar eclipse of May 30, 1965. This comprised a series of bright arches centered approximately on a quiescent prominence. A bright ray originated near the top of one of the arches and pointed almost radially away from the photosphere. The ray could be followed for 1.5 solar radii and was deflected towards a direction parallel to the equatorial plane. By comparing the photographs with Fraunhofer maps and magnetograms, the following interpretation of the structure was obtained. The prominence lies above the neutral line of an extended bipolar magnetic region. The bright arches coincide with flux tubes arising from small photospheric regions of enhanced magnetic-field strength. The ray represents a projection view of a thin region of enhanced plasma density in the neighborhood of a current sheet which separates two flux tubes of opposite polarity. The ray is interpreted as a coronal streamer, and it is suggested that all streamers are related to current sheets.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [s.l.] : Nature Publishing Group
    Nature 226 (1970), S. 1130-1131 
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] RECENTLY Schatten predicted1 the structure of the corona at the eclipse of March 7, 1970. The prediction was based on a projection onto the celestial plane of the coronal magnetic field resulting from a Green's function solution for the magnetic potential between the photosphere and a spherical ...
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    International journal of infrared and millimeter waves 5 (1984), S. 1589-1595 
    ISSN: 1572-9559
    Keywords: reflectance ; far infrared ; optical black ; opaque coatings
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A reflecting-layer model of the specular reflectance of a rough, thick, absorbing, dielectric film has been developed and fitted to the spectra of seven optical-black coatings between 12 and 300 μm. The coatings were quite different. At 100 μm their reflectance varied by a factor of nearly 103. The model determines optical constants and surface parameters, and indicates which parameters control reflectance in the far IR.
    Type of Medium: Electronic Resource
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  • 4
    Publication Date: 1984-12-01
    Print ISSN: 1866-6892
    Electronic ISSN: 1866-6906
    Topics: Physics
    Published by Springer
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  • 5
    Publication Date: 1968-09-01
    Print ISSN: 0038-0938
    Electronic ISSN: 1573-093X
    Topics: Physics
    Published by Springer
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  • 6
    Publication Date: 1970-06-01
    Print ISSN: 0028-0836
    Electronic ISSN: 1476-4687
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Published by Springer Nature
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  • 7
    Publication Date: 2011-08-24
    Description: Specular and diffuse reflectance measurements made near normal incidence of two very rough, solid aluminum surfaces are presented for the wavelength range from 2.2 to 512 microns. The diffuse measurements made at nonspecular angles by two different detectors indicate that between 33 and 201 microns the reflectance of one surface is nearly Lambertian (isotropic) with a bidirectional reflectance distribution function (BRDF) value within 32 percent of the theoretical value of (1/pi)/sr for a perfectly diffuse, perfect reflector. Photometric reflectance spectra at the specular angle show that between 6.9 and 100 microns the specular BRDF of these surfaces is within 5 percent of the theoretical value of (1/pi)/sr. At longer wavelengths of 235, 320, and 512 microns the specular reflectance rapidly departs from that of a perfectly diffuse, perfect reflector. The two samples studied have rms surface roughnesses of 44 and 60 microns. A durable metal surface with these near perfect reflectance characteristics can be advantageously used in the FIR as a black-body source, the interior surface of an integrating sphere, and most especially as an absolute calibration standard. BRDF measurements at 40 deg incidence, though still highly diffuse, show a significant departure from Lambertian reflectance.
    Keywords: OPTICS
    Type: In: Stray radiation in optical systems II; Proceedings of the Meeting, San Diego, CA, July 20-22, 1992 (A93-55176 24-74); p. 252-261.
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  • 8
    Publication Date: 2011-08-24
    Description: The manner in which diffraction can increase the reflectance measured from very rough surfaces is shown by observations of diffracted light within the instrument profile of a far-IR reflectometer system. A correction to the calibration signal based on numerical integration of the diffracted part of the instrument profile is described. Diffraction correction factors as large as 2.94 have been found with small optics at long wavelength (630 microns). The effect of diffraction on diffuse reflectance measurements of a very rough perfect reflector is shown at wavelengths from 56 to 200 microns.
    Keywords: INSTRUMENTATION AND PHOTOGRAPHY
    Type: In: Stray radiation in optical systems II; Proceedings of the Meeting, San Diego, CA, July 20-22, 1992 (A93-55176 24-74); p. 47-58.
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  • 9
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2011-08-23
    Description: A reflecting-layer model of the specular reflectance of a rough, thick, absorbing, dielectric film has been developed and fitted to the spectra of seven optical-black coatings between 12 and 300 micrometers. The coatings were quite different. At 100 micrometers their reflectance varied by a factor of nearly 10(exp 3). The model determines optical constants and surface parameters, and indicates which parameters control reflectance in the far IR.
    Keywords: Optics
    Type: International Journal of Infrared and Millimeter Waves (ISSN 0195-9271); Volume 5; No. 12; 1589-1595
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  • 10
    Publication Date: 2011-08-19
    Description: More than 40 reflectance spectra in the range from 20 to 500 microns have been obtained of a variety of coatings, binders, and additives to identify promising components of an infrared-opaque coating for the Space Infrared Telescope Facility. Certain combinations of materials showed a specular reflectance below 0.1 throughout the spectral range measured. In addition to estimating the optical constants of several combination coatings, this survey also supports three qualitative conclusions: (1) promising 'off-the-shelf' binders of different additives are Chemglaze Z-306, ECP-2200, and De Soto Black; (2) carbon black is very effective reducing far-infrared reflectance; and (3) the far-infrared reflectance from coatings containing 80 SiC grit is consistently lower than that from similar coatings containing TlBr powder.
    Keywords: OPTICS
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