Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
71 (1997), S. 2433-2435
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present the results of pressure-dependent photoluminescence (PL) studies of single-crystal InxGa1−xN (0≤x〈0.15) films grown on top of thick GaN epitaxial layers by metalorganic chemical vapor deposition with sapphire as substrates. PL measurements were performed at 10 K as a function of applied hydrostatic pressure using the diamond-anvil-cell technique. The luminescence emissions from the InxGa1−xN epifilms were found to shift linearly toward higher energy with increasing pressure. By examining the pressure dependence of the PL spectra, the pressure coefficients for the emission structures associated with the direct band gap of InxGa1−xN were determined. The values of the pressure coefficients were found to be 3.9×10−3 eV/kbar for In0.08Ga0.92N and 3.5×10−3 eV/kbar for In0.14Ga0.86N. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.120083
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