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  • 1
    Electronic Resource
    Electronic Resource
    Design consideration in an ultrafast scanning tunneling microscope (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4130-4134 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe an ultrafast scanning tunneling microscope (USTM) with picosecond temporal resolution. We present results of single-point ultrafast tunneling measurements and outline some of the methods and pitfalls in USTM. Ultimately, the technique has the potential to create picosecond scale movies of surface phenomena with atomic spatial resolution. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145359
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  • 2
    Electronic Resource
    Electronic Resource
    Calibration of frictional forces in atomic force microscopy (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3298-3306 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an in situ experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147411
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  • 3
    Electronic Resource
    Electronic Resource
    A variable temperature ultrahigh vacuum atomic force microscope (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 5266-5271 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈100 K to room temperature. AFM operation above room temperature is also possible. The microscope head is capable of coarse x-y positioning over millimeter distances so that AFM images can be taken virtually anywhere upon a macroscopic sample. The optical beam deflection scheme is used for detection, allowing simultaneous normal and lateral force measurements. The sample can be transferred from the AFM stage to a low energy electron diffraction/Auger electron spectrometer stage for surface analysis. Atomic lattice resolution AFM images taken in UHV are presented at 110, 296, and 430 K. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146097
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  • 4
    Electronic Resource
    Electronic Resource
    Scanning force microscope and vacuum chamber for the study of ice films: Design and first results (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1781-1784 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present the design of a scanning force microscope and vacuum chamber for the growth and imaging of ice films in thermodynamic equilibrium and under controlled super or undersaturation. The apparatus allows measurements in the temperature range from −60 to +80 °C in a controlled water vapor atmosphere. First results on the morphology and the frictional properties of thin ice films on mica cleavage faces are presented. The films are found to grow in a two-dimensional manner, often exhibiting dendritic growth shapes. The lateral force measured on ice is higher than that observed on the surrounding substrate. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148841
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  • 5
    Electronic Resource
    Electronic Resource
    Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 1548-1550 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a technique to measure the lateral stiffness of the nanometer-sized contact formed between a friction force microscope tip and a sample surface. Since the lateral stiffness of an elastic contact is proportional to the contact radius, this measurement can be used to study the relationship between friction, load, and contact area. As an example, we measure the lateral stiffness of the contact between a silicon nitride tip and muscovite mica in a humid atmosphere (55% relative humidity) as a function of load. Comparison with friction measurements confirms that friction is proportional to contact area and allows determination of the shear strength. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118639
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  • 6
    Electronic Resource
    Electronic Resource
    Tribocharging phenomena in hard disk amorphous carbon coatings with and without perfluoropolyether lubricants (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 3993-3998 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning polarization force microscopy was used to study changes in surface potential (tribocharging) caused by the contact between a tungsten carbide tip and the amorphous carbon coating of a hard disk, both when bare and when covered with Zdol-TX lubricant. The surface potential change produced by tip contact decays with time at a rate that is strongly dependent on lubricant coverage and on the presence of oxygen and water vapor in the environment. Two different charging mechanisms are proposed. One involves chemical modification of the surface by removal of oxygen bound to the surface. This gives rise to a potential change that decays with time. Another mechanism involves trapping of charge in states within the energy gap of the insulating carbon film. The potential change due to this trapped charge does not decay over periods much greater than 1 h. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1351001
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  • 7
    Electronic Resource
    Electronic Resource
    A new system for LEED intensity measurements using a real-time digital video processor (1986)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 3012-3018 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new system for low-energy electron diffraction (LEED) intensity measurements has been developed using a video camera and digital processing of the video signal. Complete two-dimensional LEED patterns are digitized in real time with high resolution using a commercial video processor. Intensity-voltage (I-V) data on all beams in complex LEED patterns are collected simultaneously. A microcomputer analysis program automatically tracks the diffraction beams as a function of energy and calculates beam position, size, and integrated intensity, including a local background correction. Using a video tape recorder for intermediate data storage, a complete set of I-V curves can be collected in less than 100 s.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138983
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  • 8
    Electronic Resource
    Electronic Resource
    Ultrafast scanning probe microscopy (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2567-2569 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-A(ring) spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.110435
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  • 9
    Electronic Resource
    Electronic Resource
    Advances in ultrafast scanning tunneling microscopy (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 1321-1323 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Time resolved tunnel current was measured over 4 orders of magnitude in separation between tip and sample using an ultrafast scanning tunneling microscope (USTM). These measurements reveal two distinct regimes for tip height dependence of the signal. In addition, we report 900 femtosecond temporal resolution with a sensitivity of 20 mV/(square root of)Hz in USTM measurements of voltage pulses on a coplanar transmission line, and we show that the microscope operates as a high impedance probe. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.117581
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  • 10
    Electronic Resource
    Electronic Resource
    An ultrahigh vacuum scanning tunneling microscope for surface science studies (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 3769-3775 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the construction and operation of a scanning tunneling microscope designed in our laboratory that fits standard ultrahigh vacuum (UHV) systems as an add-on instrument. Sample motion is accomplished by electrical signals, eliminating mechanical feedthroughs. Samples are easily transferred to a modified Varian manipulator for heating and interfacing with other surface science techniques. In situ tip replacement and sample transfer in and out of the UHV system is also possible.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141551
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