Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
67 (1996), S. 2957-2959
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We built a scanning force microscope working in ultrahigh vacuum. The lever deflection is measured by a fiber-optic interferometer. To detect large lever deflections the distance between the fiber end and the cantilever backside is controllable by a piezoelectric device. With this technique force–distance curves can be acquired even over large distances. We implemented a stepper motor with gear reduction system for coarse approach in our microscope. First measurements of thin gold films grown on mica obtained in situ at 10−8 Pa are presented. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147079
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