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    Self-checking sequential circuit design using m-out-of-n codes (1993)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: A technique for designing sequential circuits which are totally self-checking for single stuck at faults is presented. This technique uses m-out-of-n codes for state assignments and for output encoding. The next stage logic and the output logic are implemented such that any stuck-at-fault will either create a single bit error or unidirectional multibit error at the output. The technique has been applied to MCNC benchmark circuits and the overhead is estimated.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: Electronics Letters (ISSN 0013-5194); 29; 1; p. 7-9.
    Format: text
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    NASA TECHNICAL REPORTS
  • 2
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    Off-Line Testing for Bridge Faults in CMOS Domino Logic Circuits (1997)
    In:  CASI
    Details
    Publication Date: 2019-08-16
    Description: Bridge faults, especially in CMOS circuits, have unique characteristics which make them difficult to detect during testing. This paper presents a technique for detecting bridge faults which have an effect on the output of CMOS Domino logic circuits. The faults are modeled at the transistor level and this technique is based on analyzing the off-set of the function during off-line testing.
    Keywords: Computer Programming and Software
    Type: URC97020 , NASA University Research Centers Technical Advances in Education, Aeronautics, Space, Autonomy, Earth and Environment; 1; 115-120
    Format: application/pdf
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    NASA TECHNICAL REPORTS
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