Publication Date:
2014-10-10
Description:
Photoelectric relaxation spectroscopy (photoinduced current relaxation spectroscopy, PICTS) is used to study pure and La-doped single crystals of TlInS 2 . The characteristics of electrically active defects are determined including the capture cross section for charge carriers, the thermal activation energy, and the temperature interval within which the charge state of a defect varies. The pyroelectric properties of TlInS 2 :La are studied. The defect responsible for the anomalies in the pyrocurrent is identified.
Print ISSN:
1063-777X
Electronic ISSN:
1090-6517
Topics:
Physics
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