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  • 11
    Publication Date: 2013-08-29
    Description: Variability in the methods and models used for single event upset calculations in microelectronic memory devices can lead to a range of possible upset rates. Using heavy ion and proton data for selected DRAM and SRAM memories, we have calculated an array of upset rates in order to compare the Adams worst case interplanetary solar flare model to a model proposed by scientists at the Jet Propulsion Laboratory. In addition, methods of upset rate calculation are compared: the Cosmic Ray Effects on Microelectronics CREME code and a Monte Carlo algorithm developed at the Applied Physics Laboratory. The results show that use of a more realistic, although still conservative, model of the space environment can have significant cost saving benefits.
    Keywords: SOLAR PHYSICS
    Type: New Mexico Univ., The Fifth NASA Symposium on VLSI Design; 13 p
    Format: text
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  • 12
    Publication Date: 2013-08-31
    Description: Gallium arsenide (GaAs) solar cells for space applications from three different manufactures were irradiated with 10 MeV protons or 1 MeV electrons. The electrical performance of the cells was measured at several fluence levels and compared. Silicon cells were included for reference and comparison. All the GaAs cell types performed similarly throughout the testing and showed a 36 to 56 percent power areal density advantage over the silicon cells. Thinner (8-mil versus 12-mil) GaAs cells provide a significant weight reduction. The use of germanium (Ge) substrates to improve mechanical integrity can be implemented with little impact on end of life performance in a radiation environment.
    Keywords: SPACECRAFT PROPULSION AND POWER
    Type: NASA. Lewis Research Center, Space Photovoltaic Research and Technology Conference; 11 p
    Format: application/pdf
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  • 13
    Publication Date: 2013-08-31
    Description: A computer program was used to analyze the illuminated I-V characteristics of four sets of gallium arsenide (GaAs) solar cells irradiated with 1-MeV electrons and 10-MeV protons. It was concluded that junction regions (J sub r) dominate nearly all GaAs cells tested, except for irradiated Mitsubishi cells, which appear to have a different doping profile. Irradiation maintains or increases the dominance by J sub r. Proton irradiation increases J sub r more than does electron irradiation. The U.S. cells were optimized for beginning of life (BOL) and the Japanese for end of life (EOL). I-V analysis indicates ways of improving both the BOL and EOL performance of GaAs solar cells.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Research Center, Space Photovoltaic Research and Technology Conference; 6 p
    Format: application/pdf
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  • 14
    Publication Date: 2017-09-27
    Description: Astronauts who spend months and years traveling long distances in spacecraft and working on other planets will be subjected to high energy radiation of galactic and solar origin without the protection of the Earth's thick (one writer has called it buff) atmosphere and magnetic field. The lack of natural protection will allow high energy cosmic ray particles and solar protons to crash directly into relatively thin spacecraft walls and planetary atmospheres producing energetic secondary particles in these collisions. A substantial fraction of these secondaries will be neutrons that carry no electric charge and, consequently, are difficult to detect. At sea level on Earth the remaining neutrons are the result of many generations (approximately 10) of collisions, have very low energies (scientists call them thermal neutrons), and do not penetrate deeply into the human body. They do contribute to the natural background radiation seen by humans on Earth, but much of the dose is only at the surface or skin of the body. In the International Space Station or on the surface of Mars, the secondary neutrons will be the result of only one or two generations of interaction due to the thinner (about a factor of 20 compared to the Earth's atmosphere) walls or atmosphere, have considerably more energy and penetrate deeply into the human body. In addition, neutrons are substantially moderated by hydrogenous material such as water. A significant fraction of the water exists in the astronaut's body. Therefore, the neutron can not only penetrate more deeply into the body, but also be stopped there and deposit all or most of its radiation dose in organs such as the liver, spleen, kidney, etc. We hypothesize that the risk of serious cancers will be increased for the exposed humans. The portable, real time neutron spectrometer being developed by our team will monitor the environment inside spacecraft structures and on planetary surfaces. Activities supported by this grant will evaluate the neutron environment inside several candidate spacecraft materials at accelerator facilities. These experiments will enable engineers to choose the structure materials that minimize the production of secondary neutrons. With the information that the neutron energy spectrometer produces, scientists and doctors will be able to assess the increased risk of cancer and develop countermeasures. The instrument itself will include an alarm system to warn astronauts when high radiation fluxes are occurring so that they can seek shelter immediately.
    Keywords: Instrumentation and Photography
    Type: Microgravity Materials Science Conference 2000; Volume 2; 419-421; NASA/CP-2000-210827/VOL2
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  • 15
    Publication Date: 2019-07-13
    Description: The results of a study carried out in order to manufacture and verify the quality of chip-on-board (COB) packaging technology are presented. The COB, designed for space applications, was tested under environmental stresses, temperature cycling, and temperature-humidity-bias. Both robustness in space applications and in environmental protection on the ground-complete reliability without hermeticity were searched for. The epoxy-parylene combinations proved to be superior to other materials tested.
    Keywords: Electronics and Electrical Engineering
    Type: ; 199-204|ESA Electronic Components Conference; Apr 22, 1997 - Apr 25, 1997; Noordwijk; Netherlands
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