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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 15 (1999), S. 173-189 
    ISSN: 1573-0727
    Keywords: OBDDs ; verification ; abstraction ; extracted control flow machine ; coverage analysis ; test generation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Despite great advances in the area of Formal Verification during the last ten years, simulation is currently the primary means for performing design verification. The definition of an accurate and pragmatic measure for the coverage achieved by a suite of simulation vectors and the related problem of coverage directed automatic test generation are of great importance. In this paper we introduce a new set of metrics, called the Event Sequence Coverage Metrics (ESCMs). Our approach is based on a simple and automatic method to extract the control flow of a circuit so that the resulting state space can be explored for validation coverage analysis and automatic test generation. During simulation we monitor, in addition to state and transition coverage, whether certain control event sequences take place or not. We then combine formal verification techniques, using BDDs as the underlying representation, with traditional ATPG and behavioral test generation techniques to automatically generate additional sequences which traverse uncovered parts of the control state graph, or exercise an uninstantiated control event sequence.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 16 (2000), S. 67-81 
    ISSN: 1573-0727
    Keywords: microprocessor design validation ; test generation ; coverage measurement
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Design validation is becoming more and more a bottleneck in the microprocessor design process. The difficulty of validation stems from the complexity of the design, which requires searching an enormous space to check correctness. This is exacerbated by features for enhancing performance, such as pipelines, which are becoming common in most microprocessors. This paper describes a new abstraction technique to handle this problem. Our solution is a novel method to identify the control states automatically from the processor HDL description and to extract an abstract finite state machine model which preserves the behaviors of the design accurate to the clock cycle, so that the state space to be analyzed is drastically reduced. This model is used to evaluate microarchitecture-level coverage of validation tests. We also present validation test generation algorithm for traversing state transition paths and covering snapshot and temporal events. These abstract paths with a finite length, along with information about the instruction set, are used to generate system-level tests. Results on example microprocessor models show the technique is efficient in finding bugs that other verification methods miss.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 3 (1992), S. 359-366 
    ISSN: 1573-0727
    Keywords: Current tests ; I DDQ ; logic tests ; test generation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract This article presents an approach to developing high quality tests for switch-level circuits using both current and logic test generation algorithms. Faults that are aborted or undetectable by logic tests may be detected by current tests, or vice versa. An efficient switch level test generation algorithm for generating current and logic tests is introduced. Clear definitions for analyzing the effectiveness of the joint test generation approach are derived. Experimental results are presented for demonstrating high coverage of stuck-at, stuck-on, and stuck-open faults for switch level circuits when both current and logic tests are used.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 2 (1991), S. 351-372 
    ISSN: 1573-0727
    Keywords: Built-in self-test ; design-for-testability ; iterative logic array ; pseudo-exhaustive test ; test generation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract In this article we discuss a test generation, design-for-testability and built-in self-test methodology for two-dimensional iterative logic arrays (ILAs) that perform arithmetic functions. Our approach is unique because a single graph labeling procedure is used to generate test vectors, implement design-for-testability as well as design the circuitry for built-in self-test. The graph labeling is based on mathematical properties of full-addition such as symmetry and self-duality. Circuit modifications are introduced by a systematic procedure based on the graph labeling, that enable them to be tested with a fixed number of tests irrespective of their size. The approach is novel as it also greatly simplifies the processes of on-chip test vector generation and response comparison that are necessary for built-in self-test. Each circuit module is tested in a pseudo-exhaustive manner with deterministic as opposed to random test sequences. This results in a comprehensive test of the circuit for which built-in self-test is designed.
    Type of Medium: Electronic Resource
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