ISSN:
1572-9605
Keywords:
Resonators
;
r.f. measurements
;
stripline
;
surface resistance
;
thin films
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract We review methods of measuring surface resistance (R s ) of thin films using stripline resonators, and present our measurements of theR s of YBa2Cu3O7−x films as a function of frequency, temperature, and r.f. magnetic field. The films were deposited on LaAlO3 substrates by two methods: (1) electron-beam coevaporation of Y, BaF, and Cu followed by annealing in O2, and (2) single-targetin situ sputtering. The measurements were obtained at frequencies from 0.4 to 10 GHz, temperatures from 4 to 90 K, and an r.f. magnetic field range from 0 to 30 Oe. At low temperature and low r.f. field at 0.4 GHz, theR s values obtained for the two deposition methods are approximately 7×10−6 and 4×10−6 Ω, respectively.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00625265
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