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  • Articles  (1)
  • bridging faults  (1)
  • Electrical Engineering, Measurement and Control Technology  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 8 (1996), S. 275-285 
    ISSN: 1573-0727
    Keywords: I DDQ test ; test selection ; bridging faults
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract I DDQ measurement is a time consuming process. Thus, reducing the number of I DDQ measurements have a great impact on the test time. Carefully selecting a few I DDQ measurement points is therefore an important problem. This problem has been studied for detecting leakage faults but not for bridging faults. We present novel algorithms to select I DDQ measurement points to detect bridging faults. Experimental results obtained are very encouraging. The method can also be used: by test generators to compress I DDQ test sets; and to maximize the fault coverage when a fixed number of measurement points are given.
    Type of Medium: Electronic Resource
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