ISSN:
1436-5073
Keywords:
elemental analysis
;
depth profiling
;
surfaces
;
interface
;
C
;
O
;
N
;
Al
;
Si
;
S
;
P
;
Ni
;
Zn
;
zinc dialkyldithiophosphate
;
GaAs
;
AlxGa1−x As
;
InP
;
tribology
;
lubricating oils
;
boundary lubrication
;
ferrous metals
;
time-of-flight
;
quantum wells
;
thin-films
;
metallisation
;
ion beam analysis
;
recoil atoms
;
ion accelerators
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract Recoil Spectrometry covers a group of techniques that are very similar to the well known Rutherford backscattering Spectrometry technique, but with the important difference that one measures the recoiling target atom rather than the projectile ion. This makes it possible to determine both the identity of the recoil and its depth of origin from its energy and velocity, using a suitable detector system. The incident ion is typically high-energy (30–100MeV)35C1,81Br or127I. Low concentrations of light elements such as C, O and N can be profiled in a heavy matrix such as Fe or GaAs. Here we present an overview of mass and energy dispersive recoil Spectrometry and illustrate its successful use in some typical applications.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01244430
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