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  • High voltage electron microscopy  (1)
  • density of valence states  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Relation between plasmons and ion-induced damaging in cellulosic derivatives (1998)
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 36 (1998), S. 319-323 
    Details
    ISSN: 0887-6266
    Keywords: cellulose polymers ; ion beam irradiation ; electron energy loss spectroscopy ; density of valence states ; Physics ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: On the basis of the Brandt-Ritchie model, we use the calculated Valence Band Density Of electronic States to explain the selectivity of the chemical modifications induced by ion irradiation in cellulose nitrate and cellulose acetate. Some consequences pertaining to the characteristics of the valence band structure are deduced with a view to electronic applications. © 1998 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 36: 319-323, 1998
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
  • 2
    Electronic Resource
    Electronic Resource
    On the counting of electrons in high voltage electron microscopy (1986)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 3 (1986), S. 135-149 
    Details
    ISSN: 0741-0581
    Keywords: High voltage electron microscopy ; Energy loss spectroscopy ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: This paper describes work on the counting of electrons in high voltage electron microscopy (HVEM). A reliable counting method is needed in order to perform quantitative experiments. A scintillator-photomultiplier device has been adapted to these needs. It has been used here, in the field of electron energy loss spectroscopy. It permits the recording of the totality of the spectrum from the no-loss peak to the inner shell excitation characteristic signals because of a dynamic equal to at least 7. A simple mounting has been made to eliminate the artifacts caused by X-ray pulses. It is shown that HVEM is favourable to the counting of electrons, and some applications are reported.
    Additional Material: 17 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060030112
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    Paper (German National Licenses)
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