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  • Polymer and Materials Science  (4)
  • FLUID MECHANICS AND HEAT TRANSFER  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Hoboken, NJ : Wiley-Blackwell
    Journal of Biomedical Materials Research 21 (1987), S. 339-353 
    ISSN: 0021-9304
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Medicine , Technology
    Notes: The kinetics of drug release from polymerdrug matrices containing an embedded magnet was continuously monitored in vitro and in vivo. The application of an oscillating magnetic field increased the rate of drug release from the polymer matrices. Within the limits of detection the increase in release occurred immediately, remained stable for as long as the field was applied, and returned exactly to baseline upon withdrawal of the field. The increase in release was directly proportional to field amplitude. The same pattern of results were observed in vivo as in vitro, though higher strength fields were required in vivo to achieve the same effect observed in vitro.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 20 (1993), S. 559-564 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Sputter-deposited non-stoichiometric tantalum nitride films are used for laser-trimmed thin-film resistors owing to their stability and processability. The films are stabilized by heating in air to form a passive Ta2O5 film. This passive film can be destroyed if the resistors are exposed to aggressive thermal or chemical conditions. Thus we have studied sputtered TaN films and resistors deposited on SiO2 and Al2O3 substrates and exposed to either KOH solutions or air at 250-500 °C for various times. The oxidized films have been characterized with Auger electron spectroscopy (AES), x-ray photelectron spectroscopy (XPS), x-ray absorption near-edge spectroscopy (XANES) and extended x-ray absorption fine structure (EXAFS). Chemical shifts in the NOO Auger spectrum have been used to show that the initial fraction of deposited TaN reacts with the SiO2 surface to form Ta2O5. X-ray photoelectron spectroscopy showed that although significant amounts of oxygen can be present in the sputered films, little of the tantalum is fully oxidized to Ta2O5. X-ray photoelectron spectroscopy was also used to show that the oxide layer slowly increases in thickness when heated in air. Finally, KTaO3 was identified by XANES on the surface of films exposed to KOH. Once the passive Ta2O5 is converted to KTaO3, further oxidation of the underlying films occurs. The mechanism of oxidation of these films and the unique advantages of each spectroscopic technique are discussed.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 3 (1981), S. 211-225 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Quantitative information from electron spectroscopy for chemical analysis requires the use of suitable atomic sensitivity factors. An empirical set has been developed, based upon data from 135 compounds of 62 elements. Data upon which the factors are based are intensity ratios of spectral lines with F1s as a primary standard, value unity, and K2p3/2 as a secondary standard. The data were obtained on two instruments, the Physical Electronics 550 and the Varian IEE-15, two instruments that use electron retardation for scanning, with constant pass energy. The agreement in data from the two instruments on the same compounds is good. How closely the data can apply to instruments with input lens systems is not known. Calculated cross-section data plotted against binding energy on a log-log plot provide curves composed of simple linear segments for the strong lines: 1s, 2p3/2, 3d5/2 and 4f7/2. Similarly, the plots for the secondary lines, 2s, 3p3/2, 4d5/2 and 5d5/2, are shown to be composed of linear segments. Theoretical sensitivity factors relative to F1s should fall on similar curves, with minor correction for the combined energy dependence of instrumental transmission and mean free path. Experimental intensity ratios relative to F1s were plotted similarly, and best fit curves were calculated using the shapes of the theoretical curves as a guide. The intercepts of these best fit curves with appropriate binding energies provide sensitivity factors for the strong lines and the secondary lines for all of the elements except the rare earths and the first series of transition metals. For these elements the sensitivity factors are lower than expected, and variable, because of multi-electron processes that vary with chemical state. From the data it can be shown that many of the commonly-accepted calculated cross-section data must be significantly in error - as much as 40% in some cases for the strong lines, and far more than that for some of the secondary lines.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 73-73 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Auger spectroscopy and X-ray photoelectron spectroscopy have evolved using different reference levels for electron energy measurement. Electron-excited Auger spectra are referenced to the vacuum level, and X-ray-excited Auger spectra are referenced to the Fermi level. This can cause confusion, especially when both are recorded in the N(E) mode in the same instrument.
    Additional Material: 1 Ill.
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  • 5
    Publication Date: 2019-06-28
    Description: Measurements of Stanton numbers, velocity profiles, temperature profiles, and turbulence intensity profiles are reported for turbulent flat plate boundary layer flows with a step change in surface roughness. The first 0.9 m length of the test surface is roughened with 1.27 mm diameter hemispheres spaced 2 base diameters apart in a staggered array. The remaining 1.5 m length is smooth. The experiments show that the step change from a rough to a smooth surface has a dramatic effect on the convective heat transfer. In many cases, the Stanton number drops below the smooth-wall correlation immediately downstream of the change in roughness. The Stanton number measurements are compared with predictions using the discrete element method with excellent results.
    Keywords: FLUID MECHANICS AND HEAT TRANSFER
    Type: ASME PAPER 91-GT-266
    Format: text
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  • 6
    Publication Date: 2019-07-13
    Description: The work reported here was motivated by concern over the use of smooth heat flux gages for heat transfer measurements on the otherwise rough turbine blades. Stanton number distributions and boundary layer profiles of mean temperature, mean velocity, and turbulence intensity are reported for a surface with a step change from a rough to a smooth surface. In most cases, the Stanton number immediately downstream of the change in roughness drops below the all-smooth-wall data at the same x-Reynolds number. The alignment of the smooth surface between the bases and crests of the roughness elements is shown to have only a weak effect on the Stanton number distribution. It is concluded that the use of smooth heat flux gages on otherwise rough surfaces can cause large errors. It is recommended that heat transfer data collected in this manner be used with caution.
    Keywords: FLUID MECHANICS AND HEAT TRANSFER
    Type: International Journal of Heat and Mass Transfer (ISSN 0017-9310); 36; 1; p. 141-146.
    Format: text
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  • 7
    Publication Date: 2019-07-13
    Description: The use is studied of smooth heat flux gages on the otherwise very rough SSME fuel pump turbine blades. To gain insights into behavior of such installations, fluid mechanics and heat transfer data were collected and are reported for a turbulent boundary layer over a surface with a step change from a rough surface to a smooth surface. The first 0.9 m length of the flat plate test surface was roughened with 1.27 mm hemispheres in a staggered, uniform array spaced 2 base diameters apart. The remaining 1.5 m length was smooth. The effect of the alignment of the smooth surface with respect to the rough surface was also studied by conducting experiments with the smooth surface aligned with the bases or alternatively with the crests of the roughness elements. Stanton number distributions, skin friction distributions, and boundary layer profiles of temperature and velocity are reported and are compared to previous data for both all rough and all smooth wall cases. The experiments show that the step change from rough to smooth has a dramatic effect on the convective heat transfer. It is concluded that use of smooth heat flux gages on otherwise rough surfaces could cause large errors.
    Keywords: FLUID MECHANICS AND HEAT TRANSFER
    Type: NASA-CR-189531 , NAS 1.26:189531
    Format: application/pdf
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