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  • 81.60  (5)
  • 42.65.-k  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 63 (1996), S. 485-489 
    ISSN: 1432-0649
    Keywords: 42.60.By ; 42.65.-k ; 42.79.Fm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A phase-sensitive single-shot autocorrelator (FROG) for the UV spectral region based on the electronic Kerr effect is demonstrated. Since the Kerr shutter technique leads to a third-order autocorrelation function, information about pulse asymmetries and pulse structures along with the temporal phase can be obtained.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-0630
    Keywords: 42.10 ; 81.60 ; 82.50
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Experiments that demonstrate quantitatively the importance of laser absorption dynamics for ultraviolet laser ablation of organic materials are presented. Laser pulse transmission measurements have been performed on 0.1 μm spin-coated polyimide films at three ultraviolet wavelengths (193 nm, 248 nm, and 355 nm) over the fluence range 10−3 −10 J/cm2. Target transmission is observed to increase with increasing fluence by a factor of ∼5 at 193 nm, and a factor of ∼10 at 248 nm. In contrast, transmission decreases by approximately one half during 355 nm target irradiation. These results are analyzed theoretically with a two-level model of chromophore absorption. This theory is also applied to reported pulsed UV-laser polyimide ablation data. It is shown that an accurate description of the fluence-dependent film absorption leads to a prediction of the etch depth versus pulse fluence relationship in good agreement with experimental data.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1432-0630
    Keywords: 42.80 ; 42.10 ; 81.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Reflectivity, transmission and scattering measurments in ArF (193 nm) excimer-laser irradiated polyimide are reported. The time dependence of transient changes in all three quantities were measured together for the first time, confirming a transient refractive-index change in the first 150 ns after irradiation. The relaxation time of the effect was measured and found to consist of both a fast and slow component similar to that previously reported in acoustic wave measurements. The fast decay in about 60 ns and the slow decay is 115 ns. Several potential mechanisms are examined which may explain the result.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1432-0630
    Keywords: 42.10 ; 81.60 ; 71.30
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Experiments involving time-resolved scattering and transmission in ArF (193 nm) excimer-laser-irradiated polyimide are reported. Scattering experiments determined that constituents of the carbon layer responsible for laser-induced electrical conductivity form between 150 and 400 ns after the excimer pulse. Transmission experiments indicate that absorbing carbon is present before the formation of organized crystallites responsible for electrical conduction and scattering.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1432-0630
    Keywords: 81.40 ; 81.60 ; 72.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Multiple-shot effects in laser processing and ablation of polyimide are examined and are found to be the dominant phenomena for processes involving several hundreds or thousands of pulses. For fluences less than 260 mJ/cm2, it was found that it is impossible to cut through 75 μm polyimide foils for an arbitrarily large number of excimer pulses even though this fluence is more than ten times the single-shot ablation threshold. The halt in etching is due to the formation, over a number of shots, of a robust carbon matrix with a deep surface roughness which is also responsible for laser-induced electrical conductivity. The effect of thermal coupling between successive shots is shown to be a dominant factor in determining the electrical properties of the carbon layer. Differences in electrical conductivity of up to 12 orders of magnitude were found for only small differences in repetition rate. Transmission electron microscopy revealed the changes in microstructure responsible for the dramatic differences in electrical properties.
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 56 (1993), S. 51-63 
    ISSN: 1432-0630
    Keywords: 42.10 ; 81.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The radiation transport involved in pulsed ultraviolet laser ablation of organic materials has been studied both theoretically and experimentally. A mathematical description of the absorption process that includes nonlinear effects such as chromophore saturation and multiphoton absorption is presented. This theoretical model accurately describes the observed polymer etch depth versus incident laser fluence relationship for various target materials, laser wavelengths, and pulse durations varying from nanoseconds to subpicoseconds. The theoretical analysis can also be used to explain observed nonlinearities in the transmission characteristics of polyimide subjected to intense KrF excimer laser irradiation.
    Type of Medium: Electronic Resource
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