ISSN:
1600-5775
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A CdTe solid-state detector was applied to the measurement of polarization-dependent total-reflection fluorescence XAFS spectra. The data revealed that the detector has good sensitivity, and this, together with its compact size, make it appropriate for in-situ measurements and removal of X-ray Bragg diffraction. The detector efficiently recorded the high-energy K-edge XAFS spectra for molybdenum oxides supported on TiO2 (110).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0909049596005250
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