ISSN:
1573-1979
Keywords:
mixed-signal test
;
transient response analysis
;
filters
;
correlation
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract Transient Response Testing (TRT) has been shown to be a viable technique for determining the functionality of a linear circuit element [1] [2] [3] [4]. The impulse response of a linear network can be used to generate a single measurement, termed the Index of Functionality (I F ) which is an absolute measurement of device functionality. Analysis is performed in the time domain and pass/fail decisions are made entirely on the strength of this single measurement. Currently there is a problem in that this measurement is dominated by the DC content of the transient responses being compared and setting functional pass/fail limits is therefore very difficult. Small DC discrepancies are quite common in observed responses but are usually due to losses in signal paths when a response is multiplexed off-chip, simulation/modelling difficulties, power supply variations or tester intrusion. Further refinements of this measurement technique, resulting in two new measurements (I F AC andI F LR ) which are and insensitive to DC signal variations, and therefore provide increased AC sensitivity, are also presented and the techniques contrasted.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01239110
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