Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
87 (2000), S. 4617-4619
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We used an rf magnetron reactive sputtering method to prepare SrMoO3 thin film on a silica glass substrate and evaluated its optical properties. The reflectivity of the blue-colored film showed a cutoff due to plasmon at ∼1.7 eV. From a Kramers–Kronig analysis of the reflectivity, the spectral dependence of dielectric constants and optical constants were obtained. They agreed in tendency with the constants determined by spectroscopic ellipsometry. The plasma frequency due to free carriers (4.5 eV) was obtained by application of a Drude model to reflectivity values, which showed that the effective mass of the conduction carrier was m*=2.1m0, where m0 is the free electron mass. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.373111
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