ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The Fabry-Perot mirror faces of a number of Zn-diffused Te-doped GaAs lasers were examined by means of scanning-electron-beam-excited charge collection (SEBECC) micrography. Many lines of subsurface damage due to mechanical polishing were observed. The micrographs of certain lasers contained dark dots and lines surrounded by white areas. These were probably due to segregation of the Te to produce regions of high Te density surrounded by denuded zones. The position and width of the p-n junction region is directly observable under certain conditions in SEBECC micrographs. By the use of double exposure photography, therefore, the relation between irregularities in the p-n junction and defects in the material can be made visible. Etching was used to check the interpretation of the SEBECC micrographs. A qualitative discussion of defect visibility and artefacts in the micrographs is given.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00585486
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