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  • 1980-1984  (1)
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    Electronic Resource
    Springer
    Colloid & polymer science 262 (1984), S. 793-797 
    ISSN: 1435-1536
    Keywords: electron microscopy ; polyethylene ; morphology ; orientation ; small-angle X-ray scattering
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The morphology of cold-drawn, rolled and annealed high-density polyethylene was investigated by transmission electron microscopy of stained sections. From the electron micrographs, a model of the structure was developed and the scattering pattern calculated. This was then compared with the corresponding small-angle X-ray scattering (SAXS) pattern, in order both to aid in the interpretation of SAXS patterns of oriented polymers, and to assess the effects of staining with chlorosulphonic acid on the morphology.
    Type of Medium: Electronic Resource
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