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  • 1990-1994  (1)
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    Multilayer diffraction at 104 keV (1993)
    In:  Other Sources
    Details
    Publication Date: 2019-08-28
    Description: We have measured the diffraction peak of a W:Si synthetic multilayer reflector at 104 keV using the High Energy Bonse-Hart Camera at the X-17B hard X-ray wiggler beam line of the National Synchrotron Light Source at Brookhaven National Laboratory. The characteristics of the diffraction peak are described and compared to theory.
    Keywords: NUCLEAR AND HIGH-ENERGY PHYSICS
    Type: In: Multilayer and grazing incidence X-ray(EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992 (A93-39601 15-74); p. 324-330.
    Format: text
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