Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
65 (1994), S. 787-789
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
In a new combined atomic force microscope/scanning electron microscope, we have been able to fabricate and test electron-beam-deposited tips (e-beam tips). With this instrument it was possible to test newly grown e-beam tips within a few minutes of their formation, without ever breaking vacuum. Typical results on oxide-sharpened conventional tips showed that the radius of curvature could be reduced by a factor of 2.5 with the e-beam tips.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.112231
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