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  • Instrumentation and Photography  (1)
  • 1995-1999  (1)
  • 1
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2019-07-17
    Description: Since the introduction of thermopile, pyranometers (solar, e.g., 0.3-3.0 micrometers) and pyrgeometers (terrestrial, e.g., 4-50 micrometers) have become instruments commonly used for measuring the broadband hemispherical irradiances at the surface in a long-term, monitoring mode for decades. These commercially available radiometers have been manufactured in several countries such as from the United States, Asia, and Europe, and are generally reliable and economical. These worldwide distributions of surface measurements become even more important in the era of Earth remote sensing in studying climate forcing. However, recent studies from field campaigns have pointed out that erroneous factors (e.g., temperature gradients between the filter dome and detector, emissivity of the thermopile) are responsible for the unacceptable level of uncertainty (e.g., 10-20 W m (exp -2)). Using a newly developed instrument of Quantum Well Infrared Photodetector (QWIP), we have characterized the brightness temperature fields of pyranometers and pyrgeometers under various sky conditions. The QWIP is based on the superlattice (GaAs/AlGaAs) technology and has a noise equivalent temperature (NE delta T) less than 0.1 K. The quality of pyranometer and pyrgeometer measurements can be improved largely by applying proper knowledge of the thermal parameters affecting the operation of the thermopile systems. For example, we show a method to determine the "dome factor" (the longwave emission divided by the longwave transmission of a pyrgeometer dome) from field measurements. The results show, and are verified independently by the QWIP, that our dome factors of 0.59 and 0.90 are much smaller than the value of 4.0 assumed by the WMO (World Meteorological Organization). Data correction procedure and algorithm will be presented and discussed.
    Keywords: Instrumentation and Photography
    Type: NASDA/ADEOS-II Workshop; Nov 30, 1999 - Dec 10, 1999; Kyoto; Japan
    Format: text
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