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A model-independent maximum-entropy method for the inversion of small-angle X-ray diffraction patterns (1999)

Elliott, J. A. ; Hanna, S.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 32 (1999), S. 1069-1083

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: A model-independent maximum-entropy method is presented which will produce a structural model from small-angle X-ray diffraction data of disordered systems using no other prior information. In this respect, it differs from conventional maximum-entropy methods which assume the form of scattering entities a priori. The method is demonstrated using a number of different simulated diffraction patterns, and applied to real data obtained from perfluorinated ionomer membranes, in particular Nafion™, and a liquid crystalline copolymer of 1,4-oxybenzoate and 2,6-oxynaphthoate (B–N).

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889899010560

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