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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Industrial & engineering chemistry research 34 (1995), S. 2898-2909 
    ISSN: 1520-5045
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Ground water 37 (1999), S. 0 
    ISSN: 1745-6584
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Energy, Environment Protection, Nuclear Power Engineering , Geosciences
    Notes: A spatial stochastic approach was adopted to estimate the capture zones of a welifield in eastern Netherlands near the town of Wierden. The main sources of uncertainty were found to be the hydraulic conductivity of the production aquifer and the spatial distribution and thickness of an impeding clay layer situated above the production aquifer. Both were modeled as random space functions and a Monte Carlo analysis was performed to assess the probability distributions of the capture zones for t = 25 years and t →∞. The distributions were compared with two deterministic capture zones to show how the stochastic approach preserves the discontinuous character of the impeding clay layer while the deterministic approach smooths out the discontinuities. Furthermore, it is shown how the stochastic approach reveals the uncertainty about the location of the capture zones while the deterministic approach obscures it.
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  • 3
    ISSN: 1546-1718
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Medicine
    Notes: [Auszug] Holt-Oram syndrome is characterized by upper limb malformations and cardiac septation defects. Here, we demonstrate that mutations in the human TBX5 gene underlie this disorder. TBX5 was cloned from the disease locus on human chromosome 12q24.1 and identified as a member of the T-box transcription ...
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  • 4
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 239-241 (Nov. 1996), p. 283-286 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Electrical engineering 81 (1998), S. 151-161 
    ISSN: 1432-0487
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Description / Table of Contents: Contents The spectrum of the magnetic field in the air gap of induction motors is influenced by the level of saturation of the magnetic circuit. This report deals with the effects of saturation, which are significantly different in case of yoke respectively teeth saturation. The research is done by means of numerical field calculations of a simplified model. The results are compared with a commonly used analytical approach. Beside of the reduction of the fundamental field the effects of saturation on the third and fifth space-harmonics are found to be most important. The effect on the slot harmonics is proved to be negligible for the model presented.
    Notes: Übersicht Das Spektrum des Luftspaltfelds ändert sich unter dem Einfluß der Sättigung der Eisenbereiche. Anhand numerischer Feldberechnungen wird gezeigt, daβ zwischen der Sättigung im Zahn- und Jochbereich der Maschine prinzipielle Unterschiede bestehen und welchen Einfluß sie auf das Luftspaltfeld haben. Im Mittelpunkt der Untersuchungen stehen niederpolige Luftspaltfelder, der Einfluß der Sättigung auf nutharmonische Felder wird nur schlaglichtartig behandelt. Durch Verwendung bezogener Größen wird eine Übertragbarkeit der numerisch gewonnenen Ergebnisse angestrebt. Diese werden darüber hinaus mit den Ergebnissen eines verbreiteten analytischen Verfahrens verglichen.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Electrical engineering 81 (1998), S. 151-161 
    ISSN: 1432-0487
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Description / Table of Contents: Contents The spectrum of the magnetic field in the air gap of induction motors is influenced by the level of saturation of the magnetic circuit. This report deals with the effects of saturation, which are significantly different in case of yoke respectively teeth saturation. The research is done by means of numerical field calculations of a simplified model. The results are compared with a commonly used analytical approach. Beside of the reduction of the fundamental field the effects of saturation on the third and fifth space-harmonics are found to be most important. The effect on the slot harmonics is proved to be negligible for the model presented.
    Notes: Übersicht Das Spektrum des Luftspaltfelds ändert sich unter dem Einfluß der Sättigung der Eisenbereiche. Anhand numerischer Feldberechnungen wird gezeigt, daß zwischen der Sättigung im Zahn- und Jochbereich der Maschine prinzipielle Unterschiede bestehen und welchen Einfluß sie auf das Luftspaltfeld haben. Im Mittelpunkt der Untersuchungen stehen niederpolige Luftspaltfelder, der Einfluß der Sättigung auf nutharmonische Felder wird nur schlaglichtartig behandelt. Durch Verwendung bezogener Größen wird eine Übertragbarkeit der numerisch gewonnenen Ergebnisse angestrebt. Diese werden darüber hinaus mit den Ergebnissen eines verbreiteten analytischen Verfahrens verglichen.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 15 (1999), S. 173-189 
    ISSN: 1573-0727
    Keywords: OBDDs ; verification ; abstraction ; extracted control flow machine ; coverage analysis ; test generation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Despite great advances in the area of Formal Verification during the last ten years, simulation is currently the primary means for performing design verification. The definition of an accurate and pragmatic measure for the coverage achieved by a suite of simulation vectors and the related problem of coverage directed automatic test generation are of great importance. In this paper we introduce a new set of metrics, called the Event Sequence Coverage Metrics (ESCMs). Our approach is based on a simple and automatic method to extract the control flow of a circuit so that the resulting state space can be explored for validation coverage analysis and automatic test generation. During simulation we monitor, in addition to state and transition coverage, whether certain control event sequences take place or not. We then combine formal verification techniques, using BDDs as the underlying representation, with traditional ATPG and behavioral test generation techniques to automatically generate additional sequences which traverse uncovered parts of the control state graph, or exercise an uninstantiated control event sequence.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 13 (1998), S. 137-148 
    ISSN: 1573-0727
    Keywords: native mode self-test ; functional test generation ; test synthesis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Recent studies show that at-speed functional tests are better for finding realistic defects than tests executed at lower speeds. This advantage has led to growing interest in design for at-speed tests. In addition, time-to-market requirements dictate development of tests early in the design process. In this paper, we present a new methodology for synthesis of at-speed self-test programs for microprocessors. Based on information about the instruction set, this high-level test generation methodology can generate instruction sequences that exercise all the functional capabilities of complex processors. Modern processors have large memory modules, register files and powerful ALUs with comprehensive operations, which can be used to generate and control built-in tests and to evaluate the response of the tests. Our method exploits the functional units to compress and check the test response at chip internal speeds. No hardware test pattern generators or signature analyzers are needed, and the method reduces area overhead and performance impact as compared to current BIST techniques. A novel test instruction insertion technique is introduced to activate the control/status inputs and internal modules related to them. The new methodology has been applied to an example processor much more complex than any benchmark circuit used in academia today. The results show that our approach is very effective in achieving high fault coverage and automation in at-speed self-test generation for microprocessor-like circuits.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 11 (1997), S. 119-129 
    ISSN: 1573-0727
    Keywords: timing analysis ; timing verification ; automatic test generation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Fast and correct timing verification is a critical issue in VLSIdesign. Several timing verification algorithms have been proposed in thelast few years. However, due to the huge computation time needed toeliminate false paths, existing algorithms have difficulty in performingtiming verification for large circuits. This paper presents efficientcritical path analysis algorithm based on test pattern generation with a newsensitization criterion. The algorithm does not require generation of a pathlist and elimination of false paths to find out the correct critical path ofthe circuit. The inputs which sensitize the critical path are determined aswell. The efficiency and speed of our algorithm are demonstrated using theISCAS benchmark circuits, and the critical paths are found in vastlyimproved times.
    Type of Medium: Electronic Resource
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  • 10
    ISSN: 1572-9931
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Medicine
    Notes: Abstract We have used a direct cDNA selection protocol to isolate expressed sequences from yeast artificial chromosome clones that contain approximately 900 Kb of genomic DNA from Xq21 band that is deleted in contiguous gene syndromes comprising of mixed deafness associated with stapes fixation (DFN3). In addition to identifying Brn4 (POU3f4), a POU domain containing transcription factor that is involved in DFN3 phenotype, we have isolated seven short fragment cDNAs mapping to the deleted region. Some of the selected fragments showed X-chromosome specificity and hybridized to autosomal DNA fragments, indicating the presence of a low abundance interspersed repeat in the cDNAs or their homology to some uncharacterized family of genes. In conformity with the inertness of Xq21 band our results demonstrate that the region encodes far less than the average density of genes in other parts of the genome.
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