Publication Date:
2016-06-17
Description:
Author(s): B. de la Torre, M. Ellner, P. Pou, N. Nicoara, Rubén Pérez, and J. M. Gómez-Rodríguez We show that noncontact atomic force microscopy (AFM) is sensitive to the local stiffness in the atomic-scale limit on weakly coupled 2D materials, as graphene on metals. Our large amplitude AFM topography and dissipation images under ultrahigh vacuum and low temperature resolve the atomic and moiré… [Phys. Rev. Lett. 116, 245502] Published Thu Jun 16, 2016
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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