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  • 1
    Electronic Resource
    Electronic Resource
    Surface methylene, hydrogen, and CxH species from the dissociative adsorption of diazirine on tungsten(100) at 100 K (1989)
    s.l. : American Chemical Society
    Journal of the American Chemical Society 111 (1989), S. 4106-4108 
    Details
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ja00193a055
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  • 2
    Electronic Resource
    Electronic Resource
    Sample positioner and deflection energy analyzer for measurements of photofield emission (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1206-1211 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A sample positioner and an electron energy analyzer for studies of photofield emission have been designed and constructed. The sample positioner allows photofield emission from every facet of a field emitter to be measured under illumination at arbitrary angles of light incidence and polarization. The electrons emitted from a selected facet are decelerated to a kinetic energy E0 by a series of cylindrical lenses and introduced into either one of two energy analyzers. The deflection energy analyzer, formed from two identical 127° cylindrical analyzers, is used when high-energy resolution is required. The full width at half-maximum height of the resolution function of this analyzer is proportional to E0 down to a minimum kinetic energy which is less than 0.5 eV, and is given by ΔEFWHM=(0.0390±0.0006)E0. The throughput depends on E0 due to a combination of resolution and aperturing effects, and varies as E3/20. The signal-to-noise ratio of the analyzer is limited to 2×104 by inelastic scattering of electrons. The retardation energy analyzer is used for aligning the system and for measuring the energy-integrated current.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138030
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  • 3
    Electronic Resource
    Electronic Resource
    Interface alloying at Fe/Cr interfaces and its role in exchange coupling, angular resolved Auger electron, magneto-optic Kerr effect, and Brillouin light scattering studies (invited) : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 4518-4523 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Angular resolved Auger electron studies were carried out for Fe whisker/Cr(001) interfaces which were prepared at 100, 180, 246, and 296 °C. The Cr atoms penetrate progressively into the second (counting from the surface) atomic layer at 100, 180, and 246 °C. At 296 °C the Cr atoms enter the third atomic layer. No noticeable fraction of the Cr atoms was found in the fourth atomic layer. The exchange coupling was studied in Fe whisker/Cr/Fe(001) films which were grown in a nearly perfect layer by layer mode. Magneto-optic Kerr effect and Brillouin light scattering measurements showed that the measured change in the phase of the short wavelength oscillations, the presence of a slowly varying exchange coupling bias, and the small measured values of exchange coupling are caused by the same mechanism: interface alloying. The exchange coupling in Fe whisker/Cr/nFe specimens, for n=10, 20, 30, and 40 ML, showed no obvious dependence on the Fe layer thickness. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361768
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  • 4
    Electronic Resource
    Electronic Resource
    Magnetic dichroism in angle-resolved UV photoemission from valence bands, using linearly polarized light : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6504-6506 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic dichroism measurements of the valence bands of films of fcc Co/Cu (001) have been performed using angle-resolved UV photoemission in low-symmetry, off-normal emission geometries, and linearly polarized light. Asymmetries of magnitude 4% are observed upon magnetization reversal. Evidence of both spin-dependent surface transmission and magnetic dichroism in the angular distribution of photoelectrons is seen. The asymmetry spectra indicate sensitivity to both magnetic exchange splitting and to spin–orbit splitting. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361984
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  • 5
    Electronic Resource
    Electronic Resource
    Simple window-compensation method for improving the signal-to-noise ratio in measurements of the magneto-optic Kerr effect in ultrathin films (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3280-3283 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Measurements of the magneto-optical Kerr effect in magnetic ultrathin films in ultrahigh vacuum (UHV), have a signal-to-noise ratio (S/N) which is limited by the extinction ratio of the apparatus. Although polarizing crystals with excellent extinction characteristics are usually employed for in situ measurements of films grown in UHV, the net extinction ratio is degraded by optical windows, resulting in poor signal contrast and poor S/N. A simple procedure for cancelling the effects of the windows is to slightly, but precisely, misalign the initial linear light polarization state from S or P (with respect to the sample). This technique does not require compensators or any additional optical components and is capable of an extinction ratio of 3×10−7, allowing the rapid acquisition of high quality Kerr-effect hysteresis loops with a very simple apparatus. The dependence of the extinction ratio on the initial light polarization is investigated and explained in terms of a Jones matrix analysis. Correcting for the windows is interpreted as a phase shift from the film substrate balancing phase shifts from the optical windows. The technique is applied to the acquisition of hysteresis loops for 4 ML Fe/W(001) films and a substantial improvement in S/N is demonstrated. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145494
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  • 6
    Electronic Resource
    Electronic Resource
    Simple, calibrated deposition monitor incorporated into an electron beam evaporator (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2008-2012 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A simple deposition monitor has been incorporated into a thin-film evaporator. The compact evaporator uses electron bombardment of the tip of a source wire to create an atomic beam. The current of ions in that portion of the atomic beam which falls on a collimating aperture is used to monitor the film deposition. The ion current is linearly related to the atomic beam flux, therefore allowing more precise control of the deposition rate than is obtained by monitoring the heating power delivered to the source wire. Calibration of the ion monitor within limits of ±6% requires positioning of the tip of the source wire within ±0.3 mm. This is readily accomplished using a plot of the current of bombarding electrons versus wire position. For the evaporation of iron, the calibration constant of this ion monitor is (2.50±0.15)×10−4 ions/atom.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1143991
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  • 7
    Electronic Resource
    Electronic Resource
    Electron polarimeter based on spin-polarized low-energy electron diffraction (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 2409-2418 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A compact electron polarimeter which operates at low scattering energies (100 eV) has been built and characterized. The polarimeter uses spin-dependent diffraction from a W(001) single crystal to measure the electron spin polarization of an incident electron beam. The design obtains reliable operation by attention to the input optics, the crystal mount, and the alignment procedure. The transport lens delivers the electron beam to the analyzer over an acceleration range of at least 2.0–0.33 while simultaneously keeping the angular convergence of the beam less than ±1.5°, and the magnification constant to within ∼30%. The crystal mount allows both orientation of the crystal normal to within 0.2° and flashes to 2500 K. Geometric instrumental asymmetries are linear in displacement (AD = 4%/mm) and angular displacement (Aθ = 3%/deg) of the sample. The alignment procedure and performance of the polarimeter are illustrated using spin-polarized low-energy electron diffraction rotation curves. Preliminary results suggest that the polarimeter may be operated for 1 h between cleaning cycles without degradation of the figure of merit.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142256
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  • 8
    Electronic Resource
    Electronic Resource
    Sample holder allowing precise orientation, azimuthal rotation, and high temperature flashes in ultrahigh vacuum (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 1361-1364 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A sample holder that converts a linear coaxial motion to a precise azimuthal rotation, while still allowing precise orientation of the sample normal and very high temperature flashes (〉2500 K) is described. This is accomplished using large (1 (1)/(2) in.) diameter gears and ball bearings. One gear is bored out to provide space both for a sample mounting platform capable of precise orientation of the sample normal, and for a sample heating assembly. The sample cools to close to room temperature in ten minutes, after which the original sample orientation is regained, to within 0.2°.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142500
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  • 9
    Electronic Resource
    Electronic Resource
    Magnetic susceptibility measurements of ultrathin films using the surface magneto-optic Kerr effect: Optimization of the signal-to-noise ratio (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 4212-4216 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The magnetic susceptibility, χ=∂M/∂H, can be determined for ultrathin films using the surface magneto-optic Kerr effect and an ac technique (ac-MOKE) where the response to a small, modulated H field is measured. Optimization of the signal-to-noise ratio is imperative if the measurements are to be used to extract critical scaling exponents from the small tail of χ in the paramagnetic region. These optimal conditions are different than those appropriate for more conventional static H measurements (dc-MOKE) used to generate magnetic hysteresis loops, because the relative noise contributions from the laser stability, sample stability, and detector are changed. A simple method for determining optimum conditions is demonstrated, and the technique is used to show that a 1.8 ML Fe/W(110) film has the critical exponent γ of the 2D Ising model. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148368
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  • 10
    Electronic Resource
    Electronic Resource
    Linear intensity dependence of photo-induced field emission from tungsten
    Amsterdam : Elsevier
    Surface Science Letters 116 (1982), S. A159-A160 
    Details
    ISSN: 0167-2584
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0167-2584(82)90184-0
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